Measurement of the vector character of electric fields by optical second-harmonic generation.

{
  "study_type": "engineering",
  "exposure": {
    "band": null,
    "source": null,
    "frequency_mhz": null,
    "sar_wkg": null,
    "duration": null
  },
  "population": null,
  "sample_size": null,
  "outcomes": [
    "Two-dimensional electric-field vector mapping",
    "Spatial resolution of electric-field measurement (~10 µm)"
  ],
  "main_findings": "A scheme using optical second-harmonic generation is presented to determine the vector nature of an electric field, demonstrated by mapping the two-dimensional electric-field vector of a biased transmission line structure on silicon with ~10 µm spatial resolution.",
  "effect_direction": "unclear",
  "limitations": [],
  "evidence_strength": "insufficient",
  "confidence": 0.74,
  "peer_reviewed_likely": "yes",
  "keywords": [
    "optical second-harmonic generation",
    "electric field",
    "vector measurement",
    "field mapping",
    "biased transmission line",
    "silicon",
    "spatial resolution"
  ],
  "suggested_hubs": []
}