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A new approach for explanation of specimen rupture under high electric field.

Ultramicroscopy · 2009 · Unclear · Insufficient evidence

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UnclearInsufficient evidencePaper 2830

Experimental results indicate that electrical breakdown in field-ion microscopes is initiated by impact of nanoparticles detached from a point anode in a high electric field. The authors propose that cathode plasma formation and expansion drives mechanical ru…

Study snapshot

PublicationUltramicroscopy · 2009
Study typeengineering
Reported directionUnclear
Evidence ratingInsufficient

Abstract

Failure of needle-shaped specimens under the action of high electric fields is one of the most serious problems in many field-ionization devices and methods. It was shown that the length of what was removed during discharge part of specimens in most of the cases was several orders greater than that of an initial radius of the specimen apex. Experimental results obtained in this work indicate that electrical breakdown in field-ion microscopes is initiated by the impact of nanoparticles detached from a point anode in a high electric field. A new approach for explanation of an observed specimen failure in a high electric field was proposed, where the formation and expansion of the cathode plasma play the key role in the mechanical rupture and melting of field-ion tips. The expanding plasma behaves as a dynamic capacitor plate characterized by a high velocity and increasing field strength at the specimen tip. The field rise rate at a constant voltage in a dynamic plasma-to-tip capacitor is of the order of >10(20)V/m/s. The present experimental data along with the ecton model of the vacuum breakdown allow the results to be discussed as a mechanical sample failure under the action of the superhigh positive field pulse induced by the cathode plasma expansion.

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AI evidence extraction

Structured fields below were generated from the paper’s abstract and metadata to make the evidence easier to inspect. Automated extraction may be incomplete or incorrect; verify important details against the original paper.

Study typeengineering
Effect directionunclear
PopulationNot supplied
Sample sizeNot supplied
ExposureNot supplied
Evidence strengthInsufficientConfidence: 78% · Peer reviewed: yes

Main findings

Experimental results indicate that electrical breakdown in field-ion microscopes is initiated by impact of nanoparticles detached from a point anode in a high electric field. The authors propose that cathode plasma formation and expansion drives mechanical rupture and melting by acting like a dynamic capacitor plate that increases field strength at the specimen tip, with a reported field rise rate at constant voltage of >10^20 V/m/s.

Outcomes measured

  • Specimen rupture/failure of needle-shaped tips under high electric field
  • Mechanical rupture and melting of field-ion tips
  • Electrical breakdown initiation mechanisms in field-ion microscopes

Limitations

  • No biological/health outcomes assessed (materials/device failure context)
  • Sample size and quantitative breakdown/failure rates are not provided in the abstract
  • Exposure parameters such as frequency or time course beyond qualitative descriptions are not specified
View raw extracted JSON
{
  "study_type": "engineering",
  "exposure": {
    "band": null,
    "source": "field-ion microscope / field-ionization device",
    "frequency_mhz": null,
    "sar_wkg": null,
    "duration": null
  },
  "population": null,
  "sample_size": null,
  "outcomes": [
    "Specimen rupture/failure of needle-shaped tips under high electric field",
    "Mechanical rupture and melting of field-ion tips",
    "Electrical breakdown initiation mechanisms in field-ion microscopes"
  ],
  "main_findings": "Experimental results indicate that electrical breakdown in field-ion microscopes is initiated by impact of nanoparticles detached from a point anode in a high electric field. The authors propose that cathode plasma formation and expansion drives mechanical rupture and melting by acting like a dynamic capacitor plate that increases field strength at the specimen tip, with a reported field rise rate at constant voltage of >10^20 V/m/s.",
  "effect_direction": "unclear",
  "limitations": [
    "No biological/health outcomes assessed (materials/device failure context)",
    "Sample size and quantitative breakdown/failure rates are not provided in the abstract",
    "Exposure parameters such as frequency or time course beyond qualitative descriptions are not specified"
  ],
  "evidence_strength": "insufficient",
  "confidence": 0.78,
  "peer_reviewed_likely": "yes",
  "keywords": [
    "high electric field",
    "field-ion microscope",
    "vacuum breakdown",
    "cathode plasma expansion",
    "nanoparticles",
    "specimen rupture",
    "ecton model",
    "dynamic capacitor",
    "field pulse"
  ],
  "suggested_hubs": []
}
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AI-extracted fields are generated from the abstract and metadata and may be incomplete or incorrect. This material is for informational purposes and is not medical advice.

Identifiers and source

DOI: 10.1016/j.ultramic.2008.12.003
PubMed: 19171432

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